Samsung mTower 0.3.0 TEE_PopulateTransientObject Overflow (CVE-2022-35858)
CVE-2022-35858 Published on August 4, 2022

The TEE_PopulateTransientObject and __utee_from_attr functions in Samsung mTower 0.3.0 allow a trusted application to trigger a memory overwrite, denial of service, and information disclosure by invoking the function TEE_PopulateTransientObject with a large number in the parameter attrCount.

NVD


Products Associated with CVE-2022-35858

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Exploit Probability

EPSS
0.05%
Percentile
16.45%

EPSS (Exploit Prediction Scoring System) scores estimate the probability that a vulnerability will be exploited in the wild within the next 30 days. The percentile shows you how this score compares to all other vulnerabilities.